As a general Info, I have ordered some 1M x 4 static column RAM (from a unreliable source though). If they work I'll try them out an maybe also adapt the SW to check specifically in static column mode. However static column RAM should also support Fast Page Mode and *should* be testable with the current Firmware just not specifically the static column mode.
Version 2.2 of the Software is in the Pipeline (see Github).
It will improve testing by doing Random Pattern Checks as last step when testing RAM. This step increases certainty that address lines and decoders are working correctly and there is no crosstalk between columns and rows. Downturn: It will increase Test-Time.
Static Column Ram can finally be detected and tested. Currently the 514258 RAM (256k x 4) is implemented and tested but as the logic will be similar it can be easily extended for 514002 (1M x 4) RAM.
I have to extend the Random Pattern testing to all Pin sizes and adjust Referesh Time Check accordingly. The currently available 2.2 Beta SW on Github is runnable though it lacks the Random Checks for 16 Pin & 18 Pin Versions.
Once ready I'll include some upgrade Instructions for those who want to install the new Firmware.
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